Automated Observability Investigation of Analog Electronic Circuits using SPICE

Abstract

In the present paper, a computer-aided approach
to fault observability investigation of linear analog circuits is developed. The method is based on sensitivity investigation of the test characteristics in the frequency domain. The test frequencies are selected maximizing the sensitivity of the magnitude of the test characteristics. Applying postprocessing of the simulation results using macrodefinitions in the graphical analyzer Probe, a fault observability investigation of the circuit is performed. A number of sensitivity measures are defined in Probe for observability investigation of multiple faults using pre-defined macrodefinitions. The sensitivity of S-parameters is obtained in order to investigate the fault observability at RF.